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SiC MOSFET

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SiC MOSFET

1200V 30mΩ Generatio 2 Automotiva SiC MOSFET

Introductio
Locus Originis: Zhejiang
Nomen Notae: Inventchip Technologia
Numerus Moduli: IV2Q12030D7Z
Certificatio: AEC-Q101 qualificationem adeptus


Caracteres

  • secunda Generatio Technologiae SiC MOSFET cum +18V impulso ad portam

  • Alta voltio clausura cum bassa resistentia in statu incluso

  • Celerrima commutatio cum bassa capacitatem

  • Capax altus temperatura iunctio operationis

  • Perexcellenter celer et robustus intrinsecus corpus diodae

  • Kelvin porta ingressus facilior design circuity driveris

Applications

  • Motore drivers

  • Solar inverters

  • Automotivum DC/DC converteres

  • Automotiva compressor inversions

  • Alimenta per commutationem


Contornus:

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Diagramma Notationis:

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Censurae Summae Absolutae (TC=25°C nisi aliter spec2ificatum)

Symbolum Parametrum Valor Unitas Conditiones Probationis Nota
VDS Tensio a Dreno ad Fontem 1200 V VGS =0V, ID =100μA
VGSmax (DC) Maxima tensio DC -5 ad 20 V Statio (DC)
VGSmax (Pulsus) Maxima tensio spicata -10 ad 23 V Cyclus officii<1%, et latitudo impulsi<200ns
VGSon Tollenda voltio commendata 18±0.5 V
VGSoff Demissa voltio commendata -3.5 ad -2 V
ID Continua amperitas (continua) 79 A VGS =18V, TC =25°C Fig. 23
58 A VGS =18V, TC =100°C
IDM Iusus (pulsatus) 198 A Largor pulsus limitatur per SOA Fig. 26
PTOT Totalis dissipatio potentiae 395 W TC = 25°C Fig. 24
Tstg Temperatura recondita spatium -55 ad 175 °C
TJ Temperatura operationis junctionis -55 ad 175 °C
TL Temperatura soldering 260 °C soldering undoso tantum permittitur ad leads, 1.6mm a case pro 10 s


Data Thermica

Symbolum Parametrum Valor Unitas Nota
Rθ(J-C) Resistentia Thermica ab Iunctura ad Cistellam 0.38 °C\/W Fig. 23


Caracteristicae Electrificae (TC =25. C nisi aliter specificatum)

Symbolum Parametrum Valor Unitas Conditiones Probationis Nota
Min. Typ. Max.
IDSS Drain Currentus cum voltatibus nullis in porta 5 100 μA VDS =1200V, VGS =0V
IGSS Fluxus per gate ±100 nA VDS =0V, VGS = -5~20V
VTH Voltages limen gate 1.8 2.8 4.5 V VGS=VDS , ID =12mA Fig. 8, 9
2.0 VGS=VDS , ID =12mA @ TJ =175。C
RON Statis resistentia dren-sorsus on 30 39 VGS =18V, ID =30A @TJ =25。C Fig. 4, 5, 6, 7
55 VGS =18V, ID =30A @TJ =175。C
36 47 VGS =15V, ID =30A @TJ =25。C
58 VGS =15V, ID =30A @TJ =175。C
Ciss Capacitas input 3000 pF VDS=800V, VGS =0V, f=1MHz, VAC=25mV Fig. 16
Coss Capacitas exitus 140 pF
Crss Capacitas translatio inversa 7.7 pF
Eoss Energia conservata Coss 57 μJ Fig. 17
Qg Summa accusatio portae 135 nC VDS =800V, ID =40A, VGS =-3 ad 18V Fig. 18
Qgs Facies-fontis accusatio 36.8 nC
Qgd Facies-defluxus accusatio 45.3 nC
Rg Resistentia input fontis 2.3 ω f=1MHz
EON Energia commutationis ad incendum 856.6 μJ VDS =800V, ID =40A, VGS =-3.5 ad 18V, RG(ext) =3.3Ω, L=200μH TJ =25。C Fig. 19, 20
EOFF Energia commutationis ad exstinguendum 118.0 μJ
td(on) Tempus morae ad incendum 15.4 nS
tr Tempus surgens 24.6
td(off) Tempus morae praestinatio 28.6
tF Tempus decidendi 13.6


Caracteristica Diodi Inversi (TC =25. C nisi aliter specificatum)

Symbolum Parametrum Valor Unitas Conditiones Probationis Nota
Min. Typ. Max.
VSD Voltium directum diodis 4.2 V ISD =30A, VGS =0V Fig. 10, 11, 12
4.0 V ISD =30A, VGS =0V, TJ =175. C
trr Tempus recuperationis inversae 54.8 nS VGS=-3.5V/+18V, ISD =40A, VR =800V, RG(ext) =13Ω L=200μH di/dt=3000A/μs
Qrr Electritas recuperationis inversae 470.7 nC
IRRM Summa currentis recuperationis inversae 20.3 A


Typica Efficientia (curvae)

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